Spectrum Analyzer Based Phase Measurement for Near-Field EMI Scanning
Download Whitepaper
Spectrum Analyzer Based Phase Measurement for Near-Field EMI Scanning
EMI scanning applications require the phase information of the near-field E- or H- field data along with the magnitude for creating equivalent radiation models and far-field prediction. These applications include emission source localization methods such as emission source microscopy (ESM), building an equivalent Huygen’s box model for the noise source analysis, and near-field to far-field transformation (NFFFT). Near-field data obtained from a scanning plane above the device under test (DUT) is measured by using E and H probes. For precise positioning and spatial resolution of the near-field scanned data, a robot scanning system is used.
Download Whitepaper Now
Featured Whitepapers
-
The Importance of EMC Testing for Industrial Machinery
TÜV SÜD America Inc. -
Electromagnetic Compatibility Simulations in the Automotive Sector
BETA Simulation Solutions -
Latest News
Technical Articles
Login to EMC Directory to download datasheets, white papers and more content.
Create an account on EMC Directory to get a range of benefits.
Please wait...