Broadband Phase Resolving Spectrum Analyzer Measurement for EMI Scanning Applications
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Broadband Phase Resolving Spectrum Analyzer Measurement for EMI Scanning Applications
In many EMC applications, phase information of measured fields is desired in addition to conventional magnitude-only measurements. Among these applications, near-field scanning benefits strongly as source reconstruction or the application of Huygens surfaces becomes possible if phase-resolved field data is provided. Other applications of phase-resolved near-field measurement are near-field to far-field transformation (NFFF), emission source localization methods such as emission source microscopy (ESM), near-field analysis based on the surface equivalence principle (Huygens’ Principle).
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