An Effective Method of Probe-calibration in Phase Resolved Near-field Scanning for EMI Application
Download Whitepaper
An Effective Method of Probe-calibration in Phase Resolved Near-field Scanning for EMI Application
Electromagnetic models of ICs and modules are helpful for approximately predicting the emissions of a system or the intra-system coupling. One of the modelling methods is to calculate equivalent magnetic or/and electric current sources from near-field data above or around the under test (DUT). In this approach near-field scanning technique is used to capture sufficient field information. The scanned near-field data along the Huygens surface the emission source can be applied to source reconstruction far-field calculation.
Download Whitepaper Now
Featured Whitepapers
-
The Importance of EMC Testing for Industrial Machinery
TÜV SÜD America Inc. -
Electromagnetic Compatibility Simulations in the Automotive Sector
BETA Simulation Solutions -
Latest News
Technical Articles
Login to EMC Directory to download datasheets, white papers and more content.
Create an account on EMC Directory to get a range of benefits.
Please wait...