The SX-R 20-1 Langer EMV-Technik GmbH is a Near-Field Probe Set that has a passive near-field probe for the measurement of high-frequency magnetic fields from 1 to 20 GHz. The probe head enables measurements close to the electronic assembly, e.g., IC pins, conductors, components, and interconnections to quickly locate interference sources, determine field orientation and analyze field distribution. The probe is electrically shielded and equipped with sheath current attenuation for accurate and reliable measurements. It measures 6 x 6 mm and has an SMA female connector. This probe set includes the H-field probe, a 1 m long SMA-SMA shielded measurement cable, and a Case 4 system case for up to four probes, making it a practical, high-performance tool for EMC diagnostics and development testing.